All products SPM Calibrator - Delta Microscopies

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	Calibration Standard Model 70-1D with Cert Mounted on 15mm Steel Disk for AFM each
	Calibration Standard Model 70-1D with Cert Mounted on Pin Stub Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-)
	Calibration Standard Model 70-1D with Cert Mounted on Steel Disk for AFM each
	Calibration Standard Model 70-1D with Cert Unmounted Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-)
	Calibration Standard Model 70-1D with Cert – Choose Mount Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For… Show more (+) Very High Resolution Calibration Reference and Traceable Standard for AFM, SEM, Auger, and FIB For General Purpose and Metrology Microscopes A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: […] Show less (-)
	Model 150-1D, AFM SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 150-1D, choose mount SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 150-1D, SEM pin SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 150-1D, Unmounted SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of… Show more (+) SPM Calibration Specimens Overall Benefits: – Easier testing of your SPM. – Improved accuracy of critical dimension measurements. – Accuracy: 0.5% (1 std. dev.). Features and Benefits: – Holographic fabrication – assures high accuracy and precision. – Pattern height > 100nm – provide excellent image contrast. – Uniform coverage of entire chip – save time […] Show less (-)
	Model 150-2D, AFM Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM… Show more (+) Model 150-2D Very High Resolution Reference and Traceable Standards for Magnification Calibration of AFM, SEM, Auger, and FIB General Purpose – High Precision A precision, holographic pattern provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period:144 nm pitch, two-dimensional array. Accurate to ± 1 nm. Refer to calibration certificate for […] Show less (-)

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