EM-Tec EDX-Checker S-8 with C, PTFE, Mn, Al/Cu, Co, AISI 316L and 400/1000 mesh Ni grids

Description

The EM-Tec EDX-Checker has been developed as a cost-efficient tool for quick and easy checking of calibration, performance, and resolution of an EDX system on an SEM.  Regular use of the EDX-Checker ensures optimum performance of the EDX detector. The EM-Tec EDX-Checker consists of a standard aluminium SEM pin stub with NI grids and the reference materials C, PTFE, Mn, Co, AISI 316L and Al/Cu embedded in a vacuum compatible epoxy. The EDX-Checker stub with the reference materials is polished down to 0.5um and coated with carbon. The additional Boron Nitride is not carbon coated.

The EM-Tec EDX-Checker features:

• Quick and easy EDX calibration and performance check
• Ideal for EDX Systems from EDAX, Thermo, Bruker, Oxford Instruments, IXRF, Phenom and JEOL
• Polished surface – no topography artefacts with the reference materials
• Available in two versions
• Known and consistent take-off angle due to polished surface
• Hexagonal white BN does not need conductive carbon coating
• Low magnification image and X-ray mapping calibration
• Compact and cost effective
• Available as pin stub and with adapters for JEOL and Hitachi SEMs

The EM-Tec EDX-Checker is available in two versions:

• EDX-Checker S8 with C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and Ni grids with 400 plus 1000 mesh for quick magnification calibration and mapping check. Ideally suited for table top SEMs with EDS.
• EDX-Checker LE-10 with BN, C, PTFE, Mn, Co and Al/Cu as reference materials, AISI 316L for quantitative analysis check and a 400mesh Nickel grid for quick magnification calibration and mapping check. Optimised for low element performance check.