EM-Tec TEM grid holders for surface imaging and EDX analysis with an SEM
The EM-Tec TEM grids holders enables investigating TEM samples in the SEM. They are intended for use in table top SEMs, laboratory grade SEMs, FESEMs, Auger, SIMS and light microscopes. The EM-Tec grid holder can also be used to quickly check the sample (after FIB procedures) before investigating it with a TEM. The EM-Tec grid holders are intended for use in an SEM, Auger, SIMS and light microrcopes. They are all precision machined from vacuum grade aluminium. There are three EM-Tec TEM grid holders:
EM-Tec TG4 pin stub based TEM grid holder for up to four TEM grids. Numbered positions with machined pockets and side grooves for loading/unloading the TEM grids. The TEM grids are clamped down by the top plate and a central brass screw. Through hole size is Ø2.1mm with a 60° side angle on top and base to reduce electron and X-ray scattering interference from the holder. Overall size is Ø18x3.2mm with a 15mm long standard 3.2mm pin. The longer pin creates a distance from the stage adapter to reduce electron and X-ray signals from the SEM stage.
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