Ultra High Resolution Au-C Test on JEOL Stub

With gold particles ranging from <2nm to 30nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.

Technical Data Sheet : Gold Particles On Carbon Ultra High Resolution Calibration Specimens

each

REF: D79512-02 Catégorie : Standards & Etalons, Haute résolution Brand: Jeol

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Ultra High Resolution Au-C Test on JEOL Stub

With gold particles ranging from <2nm to 30nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.

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Ultra High Resolution Au-C Test on JEOL Stub

With gold particles ranging from <2nm to 30nm, this test is suitable for ultra high resolution SEM tests such as field emission electron source. A magnification of at least 80,000x is required for this test.

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